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借自波兰语 Czochralski,为一姓氏,以发明这一方法的波兰化学家 Jan Czochralski (1885–1953) 命名。

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Czochralski (不可数)

  1. (定语化学) Czochralski process之简写
    • 1999, Reinhard Krause-Rehberg, Hartmut S. Leipner, “Basics of Positron Annihilation in Semiconductors”, 出自 Positron Annihilation in Semiconductors: Defect Studies (Springer Series in Solid-State Sciences; 127), Berlin: Springer, →ISBN, →ISSN,页号 104:
      Mascher et al. (1989b) presented a correlated investigation of electron-irradiation-induced divacancies in silicon by positron annihilation, electron paramagnetic resonance (EPR), and infrared absorption. The defects were created by 2-MeV irradiation of Czochralski-grown Si at room temperature to a dose of 1×1018 cm–2.
      (请为本引文添加中文翻译)
    • 2011, Basant Agrawal, G. N. Tiwari, “Life Cycle Energy Analysis”, 出自 Building Integrated Photovoltaic Thermal Systems: For Sustainable Developments (RSC Energy Series; 4), Cambridge: RSC Publishing, →ISBN, →ISSN,页号 284:
      The energy required to produce electronic grade silicon (EG-Si) from MG-Si is 100 kWh kg–1 and there is a 90% yield. The EG-Si is melted in a Czochralski crystal puller at 1400 °C and the silicon slowly crystallizes to form a single crystal ingot of silicon.
      (请为本引文添加中文翻译)

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Czochralski m 个人 (阴性形式 Czochralska)

  1. 男性姓氏

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